Hsiuping University of Science and Technology Institutional Repository : Item 310993100/1424
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Please use this identifier to cite or link to this item: http://ir.hust.edu.tw/dspace/handle/310993100/1424

Title: The Grain Growth and Admittance-Frequency Properties of the ZnO Semiconductor
Authors: H. Z. Chen
Date: 1998
Issue Date: 2009-02-03T07:03:25Z
Relation: SHU TEH Journal, Vol. 21, pp. 287-308
Appears in Collections:[Department of Electronic Engineering] Journal

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